Tuning methods for tunable matching networks

ABSTRACT

Methods for tuning a tunable matching network can involve comparing a source impedance of a source to a real part of a load impedance of a load. Depending on characteristics of the network, capacitances of one or more tunable capacitors can be set to correspond to device boundary parameters, and capacitances of remaining tunable capacitors can be set based on a predetermined relationship between the parameters of the capacitors, the source, the load, and other components. From these initially determined values, the capacitance value of one or more of the capacitors can be adjusted to fall within device boundary conditions and achieve a perfect or at least best match tuning configuration.

RELATED APPLICATIONS

The presently disclosed subject matter claims the benefit of U.S. Provisional Patent Application Ser. No. 61/401,727, filed Aug. 18, 2010, the disclosure of which is incorporated herein by reference in its entirety.

TECHNICAL FIELD

The subject matter disclosed herein relates generally to methods for operating electronic devices. More particularly, the subject matter disclosed herein relates to methods for tuning a tunable matching network.

BACKGROUND

Matching networks that utilize tunable components can be useful for matching variable loads and/or optimizing performance at multiple frequencies. It has been recognized, however, that tuning a network containing multiple tunable components is not an easy job without using a simulation optimizer. Even then, the match tuning of using such an optimizer can be a slow process. For example, matching 300 load impedances might take a couple of hours using currently available commercial optimizers. Furthermore, the optimizer might not be able to achieve optimum results because of the tendency of iterative values to become trapped in local minimum or maximum values.

As a result, it would be desirable for a tuning algorithm for such a tunable matching network to not only perform much faster the simulation optimizers, but also to provide a deterministic and unique solution.

SUMMARY

In accordance with this disclosure, novel methods for tuning a tunable matching network are provided. In one aspect, a method for tuning a tunable matching network can comprise a first variable capacitor comprising a terminal connected to a first node, a second variable capacitor comprising a terminal connected to a second node, and a first inductor and a third variable capacitor connected in parallel between the first and second nodes is provided. The method can comprise comparing a source impedance of a source connected to the first node to a real part of a load impedance of a load connected to the second node. When the source impedance is greater than the real part of the load impedance or when a calculated capacitance of the second variable capacitor is less than a minimum capacitance, a capacitance value of the second variable capacitor can be set to be a minimum capacitance of the second variable capacitor, and a capacitance value of the first variable capacitor can be determined based on a predetermined relationship between the capacitance of the first variable capacitor, a conductance of the source, and an equivalent conductance of the first inductor and the third variable capacitor. Alternatively, when the source impedance is less than the real part of the load impedance or when a calculated capacitance of the first variable capacitor is less than a minimum capacitance, a capacitance value of the first variable capacitor can be set to be a minimum capacitance of the first variable capacitor, and a capacitance value of the second variable capacitor can be determined based on a predetermined relationship between the capacitance of the second variable capacitor, a minimum susceptance of the first variable capacitor, an impedance of the source, a conductance of the load, and a susceptance of the load.

Either way, the method can further comprise determining a capacitive value of the third variable capacitor based on a predetermined relationship between the capacitance of the third variable capacitor, an inductance of the first inductor, and an equivalent series inductance of the first inductor and the third variable capacitor, adjusting the capacitance value of one or more of the first variable capacitor, second variable capacitor, or third variable capacitor if the capacitance value is less than a minimum capacitance or greater than a maximum capacitance for the first variable capacitor, second variable capacitor, or third variable capacitor, respectively, and setting the capacitances of the first variable capacitor, the second variable capacitor, and the third variable capacitor to be equal to the respective capacitance values.

Although some of the aspects of the subject matter disclosed herein have been stated hereinabove, and which are achieved in whole or in part by the presently disclosed subject matter, other aspects will become evident as the description proceeds when taken in connection with the accompanying drawings as best described hereinbelow.

BRIEF DESCRIPTION OF THE DRAWINGS

The features and advantages of the present subject matter will be more readily understood from the following detailed description which should be read in conjunction with the accompanying drawings that are given merely by way of explanatory and non-limiting example, and in which:

FIG. 1 a is a circuit arrangement for a tunable single section Pi matching network;

FIG. 1 b is a circuit arrangement for a tunable capacitor-bridged double Pi matching network;

FIG. 2 is a circuit arrangement for a tunable single section Pi matching network connected to a source and a load;

FIG. 3 is a flow chart illustrating a tuning method according to an embodiment of the presently disclosed subject matter;

FIG. 4 is a flow chart illustrating a tuning method according to an embodiment of the presently disclosed subject matter;

FIG. 5 is a circuit arrangement for a tunable capacitor-bridged double Pi matching network connected to a source and a load;

FIG. 6 is a flow chart illustrating a tuning method according to an embodiment of the presently disclosed subject matter;

FIGS. 7 a and 7 b are graphs illustrating input voltage standing wave ratio contour plots for networks tuned using methods according to an embodiment of the presently disclosed subject matter;

FIGS. 7 c and 7 d are graphs illustrating input voltage standing wave ratio contour plots for networks tuned using conventional simulation optimizer methods;

FIGS. 8 a and 8 b are graphs illustrating relative transducer gain results for load reflection coefficients of networks at 2170 MHz for the case of a lossless network using methods according to an embodiment of the presently disclosed subject matter and conventional simulation optimizer methods, respectively;

FIGS. 9 a and 9 b are graphs illustrating relative transducer gain results for load reflection coefficients of networks at 700 MHz using methods according to an embodiment of the presently disclosed subject matter and conventional simulation optimizer methods, respectively;

FIGS. 10 a and 10 b are graphs illustrating relative transducer gain versus load reflection coefficients using gain results for load reflection coefficients of networks at 700 MHz using methods according to an embodiment of the presently disclosed subject matter and conventional simulation optimizer methods, respectively;

FIGS. 11 a and 11 b are graphs illustrating input voltage standing wave ratio improvement for a low frequency band and a high frequency band, respectively, after using methods according to an embodiment of the presently disclosed subject matter; and

FIGS. 12 a and 12 b are graphs illustrating relative transducer gain versus frequency for a low frequency band and a high frequency band, respectively, after using methods according to an embodiment of the presently disclosed subject matter.

DETAILED DESCRIPTION

The present subject matter provides methods for tuning a tunable matching network. It is believed that the tuning methods disclosed herein can do the same job with similar accuracy as a simulation optimizer, but the speed of these methods can be more than 1000 times faster than the speed of the optimizer.

Single Pi Network Configuration

In one aspect, for example, methods according to the present subject matter can be applied to a tunable Pi network having a configuration shown in FIG. 1 a. A tunable Pi network, generally designated 10, can theoretically make all load impedances over the entire Smith chart getting conjugation match if the three tunable components in Pi network 10 can be tuned to any desired value. Pi network 10 is one of the simplest topologies, which is capable of perfectly matching the load impedances over the entire Smith chart. Of course, it should be understood, however, that the principles applied to the tuning of tunable Pi network 10 can be extended to methods of tuning other network configurations. For example, FIG. 1 b shows a capacitor-bridged double Pi network, generally designated 20, which is also sometimes referred to as a bypassed lumped-TL.

In Pi network 10 shown in FIG. 1 a, a first tunable MEMS capacitor, generally designated 11, having a first capacitance C₁ is connected to a first node 1, a second tunable MEMS capacitor, generally designated 12, having a second capacitance C₂ is connected to a second node 2, and a third tunable MEMS capacitor, generally designated 13, having a third capacitance C₃ and a first inductor, generally designated 14, having a first inductance L₁ are connected in parallel between first node 1 and second node 2. Using these three tunable MEMS capacitors 11, 12, and 13, the capacitances C₁, C₂, and C₃ thus serve as three variables for the system. To solve for an optimum configuration of the capacitances, two equations can be derived from the condition of impedance conjugation match: one from the real part and another one from imaginary part of the impedance match equation. In order to solve these two equations having three variables, a value can be assigned to one of the three capacitances.

Referring to FIG. 2, Pi network 10 can comprise a source, generally designated 31, having a source impedance Ro connected to first node 1 and a load, generally designated 32, connected to second node 2, load 32 having a load resistance R_(L) and a load inductance X_(L), with the combination of these elements defining a load impedance Z_(L) having the relationship Z_(L)=R_(L)+j X_(L). The combination of third tunable MEMS capacitor 13 and first inductor 14 can be modeled as a single equivalent element, generally designated 15, having an equivalent series resistance R_(e) and an equivalent series inductance L_(e).

In the case of load resistance R_(L) being less than or equal to source impedance R_(o), the second capacitance C₂ can be set to a minimum second capacitance C_(2,min), and a second inductance B_(C2) of the second capacitor can be set to a value equal to ωC_(2,min). Based on these settings, solutions for the values of first capacitance C₁ and second capacitance C₃ can be determined as follows:

$\begin{matrix} {C_{1} = {\frac{1}{2\; \pi \; f}\sqrt{G_{o}\left( {G_{e} - G_{o}} \right)}}} & (1) \\ {{C_{3} = \frac{L_{e} - L}{\omega^{2}L_{e}L}}{and}} & (2) \\ {L_{e} = {\frac{1}{2\; \pi \; f}\left( {\sqrt{R_{e}\left( {R_{o} - R_{e}} \right)} - X_{e}} \right)}} & (3) \end{matrix}$

where an equivalent series conductance G_(e) is equal to the inverse of equivalent series resistance R_(e). and

$\begin{matrix} {R_{e} = {{\frac{G_{L}}{G_{L}^{2} + \left( {B_{L} + B_{{C\; 2},\min}} \right)^{2}}\mspace{14mu} {and}\mspace{14mu} X_{e}} = \frac{- \left( {B_{L} + B_{{C\; 2},\min}} \right)}{G_{L}^{2} + \left( {B_{L} + B_{{C\; 2},\min}} \right)^{2}}}} & (4) \\ {Y_{L} = {\frac{1}{Z_{L}} = {{G_{L} + {j\; B_{L}}} = {\frac{R_{L}}{R_{L}^{2} + X_{L}^{2}} - {j\frac{X_{L}}{R_{L}^{2} + X_{L}^{2}}}}}}} & (5) \end{matrix}$

Alternatively, in the case of load resistance R_(L) being greater than source impedance R_(o), first capacitance C₁ can be set to a minimum first capacitance C_(1,min), and a first susceptance B_(C1) of first capacitor 11 can be set to a value equal to ωC_(1,min). Using these parameters, solutions for the values of first capacitance C₁ and second capacitance C₃ can be determined as follows:

$\begin{matrix} {C_{2} = {\frac{1}{2\; \pi \; f}\left( {\sqrt{{\frac{G_{L}}{R_{o}}\left( {1 + {R_{o}^{2}B_{{C\; 1},\min}^{2}}} \right)} - G_{L}^{2}} - B_{L}} \right)}} & (6) \\ {{C_{3} = \frac{L_{e} - L}{\omega^{2}L_{e}L}}{and}} & (7) \\ {L_{e} = {\frac{1}{2\; \pi \; f}\left( {\frac{\sqrt{{\frac{G_{L}}{R_{o}}\left( {1 + {R_{o}^{2}B_{{C\; 1},\min}^{2}}} \right)} - G_{L}^{2}}}{\frac{G_{L}}{R_{o}}\left( {1 + {R_{o}^{2}B_{{C\; 1},\min}^{2}}} \right)} + \frac{R_{o}^{2}B_{{C\; 1},\min}}{1 + {R_{o}^{2}B_{{C\; 1},\min}^{2}}}} \right)}} & (8) \end{matrix}$

A perfect conjugation match is realized if first capacitance C₁ and third capacitance C₃ resulting from Equations (1) and (2) or second capacitance C₂ and third capacitance C₃ obtained from Equations (6) and (7) are within their boundary values (i.e., C_(k,min)≦C_(k)≦C_(k,max) for k=1, 2, or 3). Otherwise, further calculations can be performed for the best match solutions based on maximizing Transducer Gain (TG)/Relative Transducer Gain (RTG) and/or minimizing voltage standing wave ratio (VSWR).

In the case of first capacitance C₁ having a value equal to a maximum first capacitance C_(1,max) of first capacitor 11 and second capacitance C₂ being equal to minimum second capacitance C_(2,min) of second capacitor 12, or in the case of first capacitance C₁ being equal to minimum first capacitance C_(1,min) of first capacitor 11 and second capacitance C₂ being equal to a maximum second capacitance C_(2,max) of second capacitor 12, equivalent series inductance L_(e) providing the best match resulting from ∂VSWR_(in)/∂L_(e)=0 can be determined by the following relationship:

$\begin{matrix} {{L_{e} = {\frac{1}{2\; \pi \; f} \cdot \frac{B_{C\; 2x} + B_{L} + {B_{C\; 1x}{R_{o}^{2}\left\lbrack {{\left( {B_{C\; 2x} + B_{C\; 2x} + B_{L}} \right)\left( {B_{C\; 2x} + B_{L}} \right)} + G_{L}^{2}} \right\rbrack}}}{\left\lbrack {\left( {B_{C\; 2x} + B_{L}} \right)^{2} + G_{L}^{2}} \right\rbrack \cdot \left( {{B_{C\; 1x}^{2}R_{o}^{2}} + 1} \right)}}}{where}{B_{Ckx} = {{{\omega \cdot C_{k,\min}}\mspace{14mu} {or}\mspace{14mu} C_{k,\max}\mspace{14mu} {for}\mspace{14mu} k} = {1\mspace{14mu} {or}\mspace{14mu} 2}}}} & (9) \end{matrix}$

In circumstances where third capacitance C₃ is calculated to be less than a minimum third capacitance C_(3,min) of third capacitor 13 or greater than a maximum third capacitance C_(3,max) of third capacitor 13, third capacitance can be set to be equal to minimum third capacitance C_(3,max) or maximum third capacitance C_(3,max), respectively. If the value of second capacitance C₂ has already been assigned to either minimum second capacitance C_(2,min) or maximum second capacitance C_(2,max), the value of first capacitance C₁ can be chosen to minimize the input VSWR of the Pi network tuner from ∂VSWR_(in)/∂C₁=0 as follows:

$\begin{matrix} {{C_{1} = {\frac{1}{2\; \pi \; f} \cdot \frac{{X_{Le}\left\lfloor {\left( {B_{L} + B_{C\; 2x}} \right)^{2} + G_{L}^{2}} \right\rfloor} - \left( {B_{L} + B_{C\; 2x}} \right)}{\left\lbrack {1 - {X_{Le}\left( {B_{L} + B_{C\; 2x}} \right)}} \right\rbrack^{2} + {X_{Le}^{2}G_{L}^{2}}}}}{where}} & (10) \\ {X_{Le} = {{\omega \; L_{e}} = {\frac{\omega \; L}{1 - {\omega^{2}{LC}_{3,\min}}}\mspace{14mu} {or}\mspace{14mu} \frac{\omega \; L}{1 - {\omega^{2}{LC}_{3,\max}}}}}} & \; \end{matrix}$

On the other hand, if first capacitance C₁ has been defined as equal to minimum first capacitance C_(1,min) or maximum first capacitance C_(1,max), second capacitance C₂ can be determined to minimize the input VSWR of the Pi network tuner derived from ∂VSWR_(in)/∂C₂=0 as follows:

$\begin{matrix} {C_{2} = {\frac{1}{2\; \pi \; f} \cdot \frac{\begin{matrix} {{X_{Le}\left\lbrack {1 - {X_{Le}{B_{L}\left( {1 + {R_{o}^{2}B_{C\; 1x}^{2}}} \right)}} + {B_{C\; 1x}{R_{o}^{2}\left( {{2\; B_{L}} + B_{C\; 1x}} \right)}}} \right\rbrack} -} \\ {R_{o}^{2}\left( {B_{L} + B_{C\; 1x}} \right)} \end{matrix}}{X_{Le}^{2} + {R_{o}^{2}\left( {1 - {X_{Le}B_{C\; 1x}}} \right)}^{2}}}} & (11) \end{matrix}$

Based on these relationships, the method for tuning a tunable matching network can follow the steps laid out in the flow chart shown in FIG. 3. Specifically, source impedance R_(o) can be compared against load resistance R_(L) (i.e., the real part of load impedance Z_(L)). In cases where source impedance R_(o) is greater than load resistance R_(L), or when a calculated value for second capacitance C₂ is less than minimum second capacitance C_(2,min), the tuning method can involve the steps outlined in Branch 1 of the flow chart illustrated in FIG. 3. Second capacitance value C₂ can be set to be equal to minimum second capacitance C_(2,min), and first capacitance C₁ can be determined based on a predetermined relationship between first capacitance C₁, source conductance G_(o), and equivalent series conductance B_(e). Specifically, using values for load conductance G_(L) and load susceptance B_(L) calculated from Equation (5), equivalent load impedance Z_(e) can be determined using Equation (4), which can in turn be used to determine values for first capacitance C₁ and equivalent series inductance L_(e) using Equations (1) and (3), respectively.

If the real part of equivalent load inductance L_(e) is less than 0, or if first capacitance C₁ is less than minimum first capacitance C_(1,min), then the tuning method can follow the steps outlined below as if source impedance R_(o) was less than load resistance R_(L), which is provided in Branch 2 of the flow chart illustrated in FIG. 3. Otherwise, third capacitance C₃ can be determined based on the predetermined relationship between third capacitance C₃, first inductance L₁, and equivalent series inductance L_(e). Specifically, if first capacitance C₁ is less than or equal to maximum first capacitance C_(1,max), third capacitance C₃ using the relationship described by Equation (2). If first capacitance C₁ is greater than maximum first capacitance C_(1,max), however, first capacitance C₁ can be set to be equal to maximum first capacitance C_(1,max), equivalent series inductance L_(e) can be re-computed using Equation (9), and third capacitance C₃ can be determined using Equation (2).

If these steps result in values for first capacitance C₁, second capacitance C₂, and third capacitance C₃ that are within the permissible ranges for each device (i.e., C_(k,min)≦C_(k)≦C_(k,max)), then a perfect match is achieved for tuning the system. Otherwise, further tuning steps can be taken to achieve a best possible match. Specifically, if third capacitance C₃ is less than minimum third capacitance C_(3,min), third capacitance C₃ can be set to be equal to minimum third capacitance C_(3,min), and the steps outlined in the flow chart illustrated in FIG. 4 can be performed. Alternatively, if third capacitance C₃ is greater than maximum third capacitance C_(3,max), third capacitance C₃ can be set to be equal to maximum third capacitance C_(3,max) if third capacitance C₃ is less than or equal to 1/(ω²L), or third capacitance C₃ can be set to be equal to minimum third capacitance C_(3,min) if third capacitance C₃ is less than or equal to 1/(ω²L). In either case, the method can further comprise the relevant steps outlined in the flow chart illustrated in FIG. 4, which is discussed hereinbelow.

In cases where source impedance R_(o) is less than load resistance R_(L), or the real part of equivalent load inductance L_(e) is less than 0 or if first capacitance C₁ is less than minimum first capacitance C_(1,min) as discussed above, the tuning method can involve the steps outlined in Branch 2 of the flow chart illustrated in FIG. 3. Specifically, first capacitance C₁ can be set to be equal to minimum first capacitance C_(1,min), and second capacitance C₂ can be determined based on the predetermined relationship between second capacitance C₂, a minimum susceptance of the first variable capacitor B_(C1,min), source impedance R_(o), load conductance G_(L), and load susceptance B_(L). In particular, values for second capacitance C₂ and equivalent series inductance L_(e) can be calculated based on the relationships defined by Equations (6) and (8), respectively. If the value for second capacitance C₂ is calculated to be less than minimum second capacitance C_(2,min), then the tuning method can be reapplied using the steps outlined in Branch 1 of FIG. 3 and discussed above.

If the value for second capacitance C₂ is determined to be less than maximum second capacitance C_(2,max), third capacitance C₃ can be calculated using Equation (6) from the value of equivalent series inductance L_(e) derived from Equation (8). Otherwise, second capacitance C₂ can be set to be equal to maximum second capacitance C_(2,max), equivalent series inductance L_(e) can be recomputed using Equation (9), and third capacitance C₃ can be calculated using Equation (6). Again, if these steps result in values for first capacitance C₁, second capacitance C₂, and third capacitance C₃ that are within the permissible ranges for each device (i.e., C_(k,min)≦C_(k)≦C_(k,max)), then a perfect match is achieved for tuning the system.

Otherwise, if third capacitance C₃ is less than minimum third capacitance C_(3,max), third capacitance C₃ can be set to be equal to minimum third capacitance C_(3,max), and the steps outlined in the flow chart illustrated in FIG. 4 can be performed. Alternatively, if third capacitance C₃ is greater than maximum third capacitance C_(3,max), third capacitance C₃ can be set to be equal to maximum third capacitance C_(3,max) if third capacitance C₃ is less than or equal to 1/(ω²L), or third capacitance C₃ can be set to be equal to minimum third capacitance C_(3,max) if third capacitance C₃ is less than or equal to 1/(ω²L). In either case, the method can further comprise the relevant steps outlined in the flow chart illustrated in FIG. 4, which is discussed hereinbelow.

If it is determined that a perfect tuning match cannot be achieved as discussed above, further tuning steps can be taken to achieve a match that is not perfect but is the best possible match for the given system parameters. Referring to FIG. 4, where first capacitance C₁ is set to minimum first capacitance C_(1,min) or to maximum first capacitance C_(1,max) and third capacitance C₃ is set to minimum third capacitance C_(3,max) or maximum third capacitance C_(3,max) for the reasons discussed above, second capacitance C₂ can be calculated using Equation (11). Alternatively, where second capacitance C₂ is set to be equal to minimum second capacitance C_(2,min) or maximum second capacitance C_(2,max) and third capacitance C₃ is set to minimum third capacitance C_(3,min), or to maximum third capacitance C_(3,max) for the reasons discussed above, first capacitance C₁ can be calculated using Equation (10) for the best match.

Once these values are determined, the best match tuning method can further involve searching for the maximum TG/RTG based on values of first capacitance C₁ and second capacitance C₂ calculated from Equations (10) and (11). The RTG is calculated by using calculations involving S parameters of the network tuner:

$\begin{matrix} {{{R\; T\; G} = \frac{{S_{21}}^{2}}{{{1 - {S_{22}\Gamma_{L}}}}^{2}}}{{where}\mspace{14mu} \Gamma_{L}\mspace{14mu} {is}\mspace{14mu} {load}\mspace{14mu} {reflection}\mspace{14mu} {coefficient}\mspace{14mu} {and}}} & (12) \\ {S_{11} = \frac{{- \left( {\overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}}} \right)} + {\left\lfloor {1 + \left( {\overset{\_}{Y_{C\; 2}} - \overset{\_}{Y_{C\; 1}}} \right) - \overset{\_}{Y_{C\; 1}Y_{C\; 2}}} \right\rfloor \cdot \overset{\_}{Z_{Le}}}}{2 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + {\left( {1 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + \overset{\_}{Y_{C\; 1}Y_{C\; 2}}} \right) \cdot \overset{\_}{Z_{Le}}}}} & (13) \\ {{S_{21} = {S_{12} = \frac{2}{2 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + {\left( {1 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + \overset{\_}{Y_{C\; 1}Y_{C\; 2}}} \right) \cdot \overset{\_}{Z_{Le}}}}}}{and}} & (14) \\ {{S_{22} = \frac{{- \left( {\overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}}} \right)} + {\left\lbrack {1 - \left( {\overset{\_}{Y_{C\; 2}} - \overset{\_}{Y_{C\; 1}}} \right) - \overset{\_}{Y_{C\; 1}Y_{C\; 2}}} \right\rbrack \cdot \overset{\_}{Z_{Le}}}}{2 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + {\left( {1 + \overset{\_}{Y_{C\; 1}} + \overset{\_}{Y_{C\; 2}} + \overset{\_}{Y_{C\; 1}Y_{C\; 2}}} \right) \cdot \overset{\_}{Z_{Le}}}}}{where}} & (15) \\ {{\overset{\_}{Z_{Le}} = \frac{Z_{Le}}{R_{o}}},{\overset{\_}{Y_{C\; 1}} = {Y_{C\; 1} \cdot R_{o}}},{{{and}\mspace{14mu} \overset{\_}{Y_{C\; 2}}} = {Y_{C\; 2} \cdot R_{o}}}} & \; \\ {Z_{Le} = {2\; \pi \; {f \cdot {L_{e}\left( {\frac{1}{Q_{Le}(f)} + j} \right)}}}} & (16) \\ {{Y_{C\; 1} = {2\; \pi \; {f \cdot {C_{1}\left( {\frac{1}{Q_{C\; 1}(f)} + j} \right)}}}}{and}} & (17) \\ {Y_{C\; 2} = {2\; \pi \; {f \cdot {C_{2}\left( {\frac{1}{Q_{C\; 2}(f)} + j} \right)}}}} & (18) \end{matrix}$

For the case where first capacitance C₁ is set to minimum first capacitance C_(1,min), and second capacitance C₂ is within the range of C_(2,min)≦C₂≦C_(2,max), RTG= RTG₁ can be calculated using Equation (12). If second capacitance C₂ is not within the range of C_(2,min)≦C₂≦C_(2,max), however, second capacitance C₂ can be set to minimum second capacitance C_(2,min) or to maximum second capacitance C_(2,max) if second capacitance C₂ is less than minimum second capacitance C_(2,min) or greater than maximum second capacitance C_(2,max), respectively, and RTG= RTG₁ can be calculated using Equation (12).

For the case where first capacitance C₁ is set to maximum first capacitance C_(1,max), and second capacitance C₂ is within the range of C_(2,min)≦C₂≦C_(2,max), RTG= RTG₂ can be calculated using Equation (12). If second capacitance C₂ is not within the range of C_(2,min)≦C₂≦C_(2,max), however, second capacitance C₂ can be set to minimum second capacitance C_(2,min) or to maximum second capacitance C_(2,max) if second capacitance C₂ is less than minimum second capacitance C_(2,min) or greater than maximum second capacitance C_(2,max), respectively, and RTG= RTG₂ , can be calculated using Equation (12).

For the case where second capacitance C₂ is set to minimum second capacitance C_(2,min), and first capacitance C₁ is within the range of C_(1,min)≦C₁≦C_(1,max), RTG= RTG₃ can be calculated using Equation (12). If first capacitance C₁ is within the range of C_(1,min)≦C₁≦C_(1,max), however, first capacitance C₁ can be set to minimum first capacitance C_(1,min) or to maximum first capacitance C_(1,max) if first capacitance C₁ is less than minimum first capacitance C_(1,min) or greater than maximum first capacitance C_(1,max), respectively, and RTG= RTG₃ can be computed using Equation (12).

For the case where second capacitance C₂ is set to maximum second capacitance C_(2,max), and first capacitance C₁ is within the range of C_(1,min)≦C₁≦C_(1,max), RTG= RTG₄ can be calculated using Equation (12). If first capacitance C₁ is within the range of C_(1 ,min)≦C₁≦C_(1,max), however, first capacitance C₁ can be set to minimum first capacitance C_(1,min) or to maximum first capacitance C_(1,max) if first capacitance C₁ is less than minimum first capacitance C_(1,min) or greater than maximum first capacitance C_(1,max), respectively, and RTG= RTG₂ can be computed using Equation (12).

Comparing RTG₁/RTG= RTG₁ , RTG₂/RTG= RTG₂ , RTG₃/RTG= RTG₃ , and RTG₄/RTG= RTG₄ , the solutions or the setting of the tunable capacitors can be selected corresponding to the largest RTG_(X) or RTG_(X) among the four RTG values calculated. The solutions can thus be one of the following permutations sets: (C_(1,min)/C_(1,max), C₂, C_(3,min)/C_(3,max)) or (C₁, C_(2,min)/C_(2,max), C_(3,min)/C_(3,max)) or (C_(1,min)/C_(1,max), C_(2,min)/ C_(2,max), C_(3,min)/C_(3,max)), where it is understood that C_(x)/ C_(y) is read as C_(x) or C_(y). These are the best match solutions that maximize the RTG.

Capacitor-Bridged Double Pi Network Configuration

Although the above discussion involved tuning methods particularly designed for use with a Pi network 10, the tuning methods according to the present subject matter can be applied to other network configurations. Specifically, for example, for the capacitor-bridged double Pi network 20 shown in FIG. 1 b, a similar method can be applied. Similar to Pi network 10 discussed above, capacitor-bridged double Pi network 20 can include a first tunable MEMS capacitor, generally designated 21, having a first capacitance C_(A) and connected to first node 1, a second tunable MEMS capacitor, generally designated 22, having a second capacitance C_(B) connected to second node 2, and a third tunable MEMS capacitor, generally designated 23, having a third capacitance C_(D) and a first inductor, generally designated 34, having a first inductance L₁ connected in parallel between first node 1 and second node 2.

This system can differ from Pi network 10 discussed above, however, in that it can have a second inductor, generally designated 25, having a second inductance L₂ arranged in series with first inductor 24 between first and second nodes 1 and 2 and a fourth variable capacitor, generally designated 26, defining a fourth capacitance C_(C) connected to a third node 3 between first inductor 24 and second inductor 25. This system can be modeled as shown in FIG. 5 as a single Pi network, with fourth variable capacitor 26 being modeled as two separate elements, a first equivalent capacitor, generally designated 27, connected between first capacitor 21 and first inductor 24 and defining a first equivalent capacitance C_(o1) and a second equivalent capacitor, generally designated 28, connected between second inductor 25 and second capacitor 22 and defining a second equivalent capacitance C_(o2), and with first inductor 24 and second inductor 25 being treated as a single equivalent inductor, generally designated 29, defining an equivalent inductance L_(o). In this way capacitor-bridged double Pi network 20 can be analyzed as if it were a single Pi network, thereby allowing for application of the equations identified above by utilizing the following formulas:

$\begin{matrix} {C_{1} = {{C_{A} + C_{o\; 1}} = {C_{A} + \frac{C_{C}}{1 + {L_{1}/L_{2}} - {\omega^{2}L_{1}C_{C}}}}}} & (19) \\ {C_{2} = {{C_{B} + C_{o\; 2}} = {C_{B} + \frac{C_{C}}{1 + {L_{2}/L_{1}} - {\omega^{2}L_{2}C_{C}}}}}} & (20) \\ {{C_{3} = C_{D}}{and}} & (21) \\ {L_{o} = {L_{1} + L_{2} - {\omega^{2}L_{1}L_{2}C_{C}}}} & (22) \end{matrix}$

It should be recognized that these formulas differ from those established with respect to the configuration of Pi network 10 with the addition of fourth capacitance C_(C). This means that the formulas developed for use with Pi network 10 and the tuning method described above can be applied equally to this configuration as long as the value for fourth capacitance C_(C) is defined. It is noted, however, that the value for fourth capacitance C_(C) in the tunable matching network optimal match tuning goes to either a minimum fourth capacitance C_(C,min) or a maximum fourth capacitance C_(C,max) at a probability of around 80% or more as discussed below. Based on a distribution of the value of fourth capacitance C_(C) over a certain area of the Smith chart, such as 0.5≦|Γ_(L)|≦0.9 at any angle, the tuning method can thus comprise the following steps.

In a first step, for a load reflection coefficient in the region of phase within −θ₁∠Γ_(L)≦+θ₂ (e.g., −70°≦∠Γ_(L)≦+90°), and magnitude within 0.5≦|Γ_(L)|≦0.9, fourth capacitance C_(C) can be set to minimum fourth capacitance C_(C,min), and values for first, second, and third capacitances C₁ through C₃ can be determined using Equations (19) through (21). The tuning method described above with reference to the flow chart shown in FIG. 3 can be followed to process match tuning calculations. In the RTG calculation of the Pi network tuning algorithm, all the components in the Pi network are related to the components in the tunable matching network by Equations (19) through (22), and values for each of the parameters of capacitor-bridged double Pi network 20 can be determined based on the following relationships (assuming a finite Q factor):

$\begin{matrix} {{\hat{C}}_{A} = {C_{A}\left( {1 - \frac{j}{Q_{CA}(f)}} \right)}} & (22) \\ {{\hat{C}}_{C} = {C_{C}\left( {1 - \frac{j}{Q_{Cc}(f)}} \right)}} & (23) \\ {{\hat{C}}_{E} = {C_{E}\left( {1 - \frac{j}{Q_{CE}(f)}} \right)}} & (24) \\ {{{\hat{C}}_{F} = {C_{F}\left( {1 - \frac{j}{Q_{CF}(f)}} \right)}}{And}} & (25) \\ {{{\hat{L}}_{k} = {L_{k}\left( {1 - \frac{j}{Q_{Lk}(f)}} \right)}}{k = {1\mspace{14mu} {and}\mspace{14mu} 2}}} & (26) \end{matrix}$

In a second step, for a load reflection coefficient in the region of phase within +180°≦∠Γ_(L)≦+180°−θ₃ (and within −180°≦∠Γ_(L)≦−180°+θ₄), and magnitude within 0.5≦|Γ_(L)|≦0.9, the method can comprise the following steps. Fourth capacitance C_(C) can be set to be equal to maximum fourth capacitance C_(C,max), and values for first, second, and third capacitances C₁ through C₃ can be determined using Equations (19) through (21). The tuning method disclosed above with reference to the Pi network can be used to obtain the maximized RTG₁. Fourth capacitance C_(C) can then be set to be equal to a value within the range of C_(C,min)≦C_(C)≦C_(C,max) (e.g., C_(C)=C_(C,mean)), and values for first, second, and third capacitances C₁ through C₃ can be again be calculated. The tuning method for the Pi network can again be used to obtain the maximized RTG₂. Values for RTG₁ and RTG₂ can be compared, and the solution of capacitance values having the larger RIG value can be selected.

In a third step, for a load reflection coefficient having a phase within the rest of region ∠Γ_(L) and a magnitude within 0.5≦|Γ_(L)|≦0.9, the method can comprise the following steps. Fourth capacitance C_(C) can be set to be equal to maximum fourth capacitance C_(C,max), and values for first, second, and third capacitances C₁ through C₃ can be determined using Equations (19) through (21). The tuning method disclosed above with reference to the Pi network can be used to obtain the maximized RTG₁. Fourth capacitance C_(C) can then be set to be equal to an average value between the boundary conditions of the fourth capacitor (i.e., C_(C)=C_(C,mean)), and values for first, second, and third capacitances C₁ through C₃ can again be calculated. The tuning method for the Pi network can again be used to obtain another maximized RTG₂. Fourth capacitance C_(C) can be set to be equal to minimum fourth capacitance C_(C,min), and values for first, second, and third capacitances C₁ through C₃ can be calculated. The tuning method for the Pi network can then be used to obtain a third maximized RTG₃. Values for RTG₁, RTG₂ and RTG₃, can be compared, and the solution of capacitance values having the larger RTG value can be selected.

Separating the calculations for load reflection coefficients within different phases can help to reduce the computation time but is not necessary. For example, optimal simulations across 700 MHz to 2700 MHz can show that in the middle section of −180°≦∠Γ_(L) ≦−180°, the value of fourth capacitance C _(c) is generally always equivalent to minimum fourth capacitance C_(c,min), and the value of fourth capacitance C_(c) is equal to maximum fourth capacitance C_(c,max) when the reflection coefficient angle is close to +or −180°. There is no a criterion for choosing the θs, so long as θ_(i) (i=1, 2, 3, or 4) is not too large.

In yet another alternative approach, the calculation of capacitance values for load reflection coefficients in the region of phase within +180°≧∠Γ_(L)≧+180°−θ₃ can be bypassed. In this case, the load reflection coefficient region for the third step can be for a phase within +180°≧∠Γ_(L)≧+180°−θ₂, within −180°≦∠Γ_(L)≦−180°+θ₁, and having a magnitude within 0.5≦|Γ_(L)|≦0.9. The third step can thus be used to determine the perfect or the best match solution of capacitance set C_(A), C_(B), C_(C), & C_(D) values with the largest RTG over the entire area of the load reflection coefficient defined in the Smith chart, for example for a phase within −180°≦∠Γ_(L)≦+180° and a magnitude within 0.5≦|Γ_(L)|≦0.9. It is to be understood, however, that more computation time can be required if this calculation approach is used.

Tuning Applications

In one common configuration, a Pi network tuner (e.g., configuration shown in FIG. 1 a) can have the following parameters: first and second tunable capacitors 11 and 12 having a tuning range from 0.8 pF to 5 pF, third tunable capacitor 13 possessing a tuning range from 0.25 pF to 4 pF, and first inductor 14 of 6.8 nH and 2.3 nH being used for low frequency band (e.g., 700 to 960 MHz) and for high frequency band (e.g., 1710 to 2170 MHz), respectively. The input VSWR contours of match tuning the load with reflection |Γ_(L)| can vary from 0.05 to 0.95 at 700 MHz by using the tuning method disclosed above and utilizing the optimizer are shown in FIGS. 7 a and 7 c, respectively. The average VSWR over the Smith chart within the region of 0.05≦∠Γ_(L)≦0.95 and −180°≦∠Γ_(L)≦180° can be 2.15 and 2.13 for the algorithm and optimizer, respectively, and the difference can be only Δ=0.02. The average VSWR over the Smith chart within the same region at 2170 MHz can be 1.212 and 1.209 resulting from the algorithm and the optimizer, respectively, as depicted in FIGS. 7 b and 7 d.

In the region of |Γ_(L)<0.5, the input VSWR can be very close to 1:1. In most cellular handset applications, a VSWR less than 3:1 is usually required after match tuning. Therefore, the most interesting area in the Smith chart to check the tuner functioning is within the region of 0.55≦|Γ_(L)≦0.90 and −180°≦∠Γ_(L)≦180°. Thus, the following discussion relates to the matching performance within this region. A comparison of the average input VSWR obtained from the optimizer and algorithm at different frequencies are given in Table 1.

TABLE 1 Optimizer Frequency Average Algorithm (MHz) VSWR Average VSWR ΔVSWR 700 3.22 3.22 0.00 960 2.31 2.31 0.00 1710 1.22 1.23 0.01 2170 1.41 1.42 0.01

The plots of the RTG versus the load reflection coefficient (e.g., 0.5≦|Γ_(L)|≦0.9 and −180°≦∠Γ_(L)≦180°at 2170 MHz derived from the tuning algorithm and the optimizer simulation are given in FIGS. 8 a and 8 c, respectively. The average RTG over the above area is found to be 3.19 dB for the algorithm and 3.20 dB for the optimizer and the difference is only 0.01 dB. A comparison of the average RTG resulting from the algorithm and the optimizer at different operating frequencies is presented in Table 2.

TABLE 2 Algorithm Frequency Optimizer Average Average RTG (MHz) RTG (dB) (dB) ΔRTG (dB) 700 2.12 2.12 0.00 960 2.68 2.67 −0.01 1710 3.31 3.30 −0.01 2170 3.20 3.19 −0.01

In the practical case, all the components of Pi network 10 can have a finite Q factor instead of infinite. Accordingly, the following provides a comparison of results achieved by the present tuning methods of a Pi network tuner with loss with those resulting from optimizer simulations. Assuming that the tuner is formed by the components with same tunable range and nominal value as defined in the previous example but having a finite Q factor, their quality factors are Q_(C1,2)=100 for first and second tunable capacitors 11 and 12, Q_(C3)=150 for third tunable capacitor 13 and Q_(L)=55 for first inductor 14. In order to take the finite Q of the components into account, the final RTG and/or input VSWR calculations can use Equations (16) through (18). In the case of the tuner with loss, the plots of the RTG versus the load reflection coefficient (0.5≦|Γ_(L)|≦0.9 and −180°≦∠Γ_(L)180 °) at 700 MHz derived from the tuning algorithm and the optimizer simulation are given in FIG. 8. The average RTG over the above area can be found to be about 1.79 dB and 1.78 dB for the optimizer and algorithm, respectively, and the difference can be only about 0.01 dB. A comparison of the average RTG resulting from the algorithm and the optimizer at different operating frequencies is presented in Table 3.

TABLE 3 Algorithm Frequency Optimizer Average Average RTG (MHz) RTG (dB) (dB) ΔRTG (dB) 700 1.79 1.78 −0.01 960 2.10 2.05 −0.05 1710 2.29 2.22 −0.07 2170 2.29 2.22 −0.07

The tuning method for capacitor-bridged double Pi network 20 can also provide very accurate results compared with the results obtained from an MWO simulation optimizer. For example, capacitor-bridged double Pi network 20 shown in FIG. 1 b can have first and second inductors 24 and 25 configured to have a combined inductance L_(o) that is substantially equivalent to the inductance L₁ of first inductor 14 of Pi network 10 and having values of about 3.4 nH for 700-960 MHz, 1.5 nH for 1710-2170 MHz, and 1.0 nH for 2500-2700 MHz, first and second capacitors 21 and 22 having minimum capacitances C_(a,min) and C_(b,min) equal to about 1.5 pF (parasitics included) and maximum capacitances C_(a,max) and C_(b,max) equal to about 6 pF, third capacitor 23 having a minimum capacitance C_(c,min) of about 0.6 pF and a maximum capacitance C_(c,max) of about 4.0 pF, fourth capacitor 26 having minimum capacitance C_(d,min) of about 0.4 pF and a maximum capacitance C_(d,max) of about 4.0 pF, and quality factors of Q_(ca)=Q_(cb)=100, Q_(cc)=Q_(cd)=150, and Q_(L)=55.

Plots of the RTG vs. load reflection coefficient at 2500 MHz resulting from the algorithm and the simulation optimizer are shown in FIG. 10. In this configuration, the difference of the average RTG obtained from the algorithm and the optimizer can be only about 0.05 dB. A comparison of the average RTG derived from the algorithm and the optimizer at other frequencies is presented in Table 4.

TABLE 4 Optimizer Algorithm ΔRTG = Frequency Average RTG Average RTG RTG_(avg)_A − (MHz) (dB) (dB) RTG_(avg)_O (dB) 700 1.85 1.83 −0.02 824 2.25 2.21 −0.04 960 2.29 2.23 −0.06 1710 2.22 2.16 −0.06 1980 2.10 2.05 −0.05 2170 1.85 1.81 −0.04 2500 1.99 1.94 −0.05 2700 1.80 1.76 −0.04

In order to demonstrate the performance of the capacitor-bridged double Pi tuning algorithm, an example for matching a handset antenna is adopted here. The reflection coefficient data measured for a particular handset antenna, for example, can be used in this study. The present method can be used to maximize the RTG for each frequency point in two different frequency bands: low band from 700 MHz to 960 MHz and high band from 1710 MHz to 2170 MHz. Exemplary data for the VSWR of the original antenna without TMN and the VSWR after using the TMN with maximizing RTG tuning for the low and high frequency bands are depicted in FIGS. 11 a and 11 b, respectively. From these two plots, it can be seen that the improvement of the input VSWR after using the TMN is clearly very significant if the tuning is performed at each frequency. It is noted that the antenna used in this example appears to have been designed for the ECell and PCS bands since in these two bands it has the lower VSWR. Therefore, its performance in 700 MHz band is very bad (e.g., the VSWR up to 43:1).

The RTG verses frequency resulting from the TMN algorithm tuning in the low and high bands is shown in FIGS. 12 a and 12 b, respectively. It is expected that large RTG can be obtained in the frequency region with high VSWR and small RTG where the VSWR is low. In fact, the RTG can also depend on where the load impedance locates in the Smith chart.

Accordingly, the tuning methods disclosed herein can do the same job with similar accuracy as the simulation optimizer, but the speed of these methods can be more than 1000 times faster than the speed of the optimizer.

The present subject matter can be embodied in other forms without departure from the spirit and essential characteristics thereof. The embodiments described therefore are to be considered in all respects as illustrative and not restrictive. Although the present subject matter has been described in terms of certain preferred embodiments, other embodiments that are apparent to those of ordinary skill in the art are also within the scope of the present subject matter. 

1. A method for tuning a tunable matching network comprising a first variable capacitor comprising a terminal connected to a first node, a second variable capacitor comprising a terminal connected to a second node, and a first inductor and a third variable capacitor connected in parallel between the first and second nodes, the method comprising: (a) comparing a source impedance of a source connected to the first node to a real part of a load impedance of a load connected to the second node; (b) when the source impedance is greater than the real part of the load impedance or when a calculated capacitance of the second variable capacitor is less than a minimum capacitance: (i) setting a capacitance value of the second variable capacitor to be a minimum capacitance of the second variable capacitor; and (ii) determining a capacitance value of the first variable capacitor based on a predetermined relationship between the capacitance of the first variable capacitor, a conductance of the source, and an equivalent conductance of the first inductor and the third variable capacitor; (c) when the source impedance is less than the real part of the load impedance or when a calculated capacitance of the first variable capacitor is less than a minimum capacitance: (i) setting a capacitance value of the first variable capacitor to be a minimum capacitance of the first variable capacitor; and (ii) determining a capacitance value of the second variable capacitor based on a predetermined relationship between the capacitance of the second variable capacitor, a minimum susceptance of the first variable capacitor, an impedance of the source, a conductance of the load, and a susceptance of the load; (d) determining a capacitive value of the third variable capacitor based on a predetermined relationship between the capacitance of the third variable capacitor, an inductance of the first inductor, and an equivalent series inductance of the first inductor and the third variable capacitor; (e) adjusting the capacitance value of one or more of the first variable capacitor, second variable capacitor, or third variable capacitor if the capacitance value is less than a minimum capacitance or greater than a maximum capacitance for the first variable capacitor, second variable capacitor, or third variable capacitor, respectively; and (f) setting the capacitances of the first variable capacitor, the second variable capacitor, and the third variable capacitor to be equal to the respective capacitance values.
 2. The method of claim 1, wherein the predetermined relationship between the capacitance of the first variable capacitor, a conductance of the source, and an equivalent conductance of the first inductor and the third variable capacitor comprises the relationship: $C_{1} = {\frac{1}{2\; \pi \; f}\sqrt{G_{o}\left( {G_{e} - G_{o}} \right)}}$ where C₁ is the capacitance of the first variable capacitor, G₀ is the conductance of the source, and G_(e) is the equivalent conductance of the first inductor and the third variable capacitor.
 3. The method of claim 1, wherein the predetermined relationship between the capacitance of the second variable capacitor, a minimum susceptance of the first variable capacitor, an impedance of the source, a conductance of the load, and a susceptance of the load comprises the relationship: $C_{2} = {\frac{1}{2\; \pi \; f}\left( {\sqrt{{\frac{G_{L}}{R_{o}}\left( {1 + {R_{o}^{2}B_{{C\; 1},\min}^{2}}} \right)} - G_{L}^{2}} - B_{L}} \right)}$ where C₂ is the capacitance of the second variable capacitor, B_(C1,min) is the minimum susceptance of the first variable capacitor, R₀ is the impedance of the source, G_(L) is the conductance of the load, and B_(L) is the susceptance of the load.
 4. The method of claim 1, wherein the predetermined relationship between the capacitance of the third variable capacitor, an inductance of the first inductor, and an equivalent series inductance of the first inductor and the third variable capacitor comprises the relationship: $C_{3} = \frac{L_{e} - L}{\omega^{2}L_{e}L}$ where C₃ is the capacitance of the third variable capacitor, L is the inductance of the first inductor, and L_(e) is the equivalent series inductance of the first inductor and the third variable capacitor.
 5. The method of claim 1, wherein adjusting the capacitance value of one or more of the first variable capacitor, second variable capacitor, or third variable capacitor comprises setting the capacitance value of the first variable capacitor, second variable capacitor, or third variable capacitor, respectively, to be equal to the minimum capacitance if the capacitance value determined is less than the minimum capacitance or to be equal to the maximum capacitance if the capacitance value determined is greater than the maximum capacitance.
 6. The method of claim 5, wherein if the capacitance values of both the first variable capacitor and the third variable capacitor are equal to either the minimum capacitance or the maximum capacitance of the first variable capacitor and the third variable capacitor, respectively, adjusting the capacitance value of one or more of the first variable capacitor, second variable capacitor, or third variable capacitor further comprises determining a new capacitance value of the second variable capacitor based on a predetermined relationship between the capacitance of the second variable capacitor, an impedance of the source, a susceptance of the load, a susceptance of the first variable capacitor, and an equivalent series reactance of the first inductor and the third variable capacitor.
 7. The method of claim 6, wherein the predetermined relationship between the capacitance of the second variable capacitor, an impedance of the source, a susceptance of the load, a susceptance of the first variable capacitor, and an equivalent series reactance of the first inductor and the third variable capacitor comprises the relationship: $C_{2} = {\frac{1}{2\; \pi \; f} \cdot \frac{\begin{matrix} {{X_{Le}\left\lbrack {1 - {X_{Le}{B_{L}\left( {1 + {R_{o}^{2}B_{C\; 1x}^{2}}} \right)}} + {B_{C\; 1x}{R_{o}^{2}\left( {{2\; B_{L}} + B_{C\; 1x}} \right)}}} \right\rbrack} -} \\ {R_{o}^{2}\left( {B_{L} + B_{C\; 1x}} \right)} \end{matrix}}{X_{Le}^{2} + {R_{o}^{2}\left( {1 - {X_{Le}B_{C\; 1x}}} \right)}^{2}}}$ where C₂ is the capacitance of the second variable capacitor, R₀ is the impedance of the source, B_(L) is the susceptance of the load, B_(C1x) is the susceptance of the first variable capacitor, and X_(Le) is the equivalent series reactance of the first inductor and the third variable capacitor.
 8. The method of claim 5, wherein if the capacitance values of both the second variable capacitor and the third variable capacitor are equal to either the minimum capacitance or the maximum capacitance of the second variable capacitor and the third variable capacitor, respectively, adjusting the capacitance value of one or more of the first variable capacitor, second variable capacitor, or third variable capacitor further comprises determining a new capacitance value of the first variable capacitor based on a predetermined relationship between the capacitance of the first variable capacitor, a conductance of the load, a susceptance of the load, a susceptance of the second variable capacitor, and an equivalent series reactance of the first inductor and the third variable capacitor.
 9. The method of claim 6, wherein the predetermined relationship between the capacitance of the first variable capacitor, a conductance of the load, a susceptance of the load, a susceptance of the second variable capacitor, and an equivalent series reactance of the first inductor and the third variable capacitor comprises the relationship: $C_{1} = {\frac{1}{2\; \pi \; f} \cdot \frac{{X_{Le}\left\lbrack {\left( {B_{L} + B_{C\; 2x}} \right)^{2} + G_{L}^{2}} \right\rbrack} - \left( {B_{L} + B_{C\; 2x}} \right)}{\left\lbrack {1 - {X_{Le}\left( {B_{L} + B_{C\; 2x}} \right)}} \right\rbrack^{2} + {X_{Le}^{2}G_{L}^{2}}}}$ where C₁ is the capacitance of the first variable capacitor, G_(L) is the conductance of the load, B_(L) is the susceptance of the load, B_(C2x) is the susceptance of the second variable capacitor, and X_(Le) is the equivalent series reactance of the first inductor and the third variable capacitor.
 10. The method of claim 1, wherein the tunable matching network further comprises a second inductor arranged in series with the first inductor between the first and second nodes and a fourth variable capacitor comprising a terminal connected to a third node between the first inductor and the second inductor; and wherein the method further comprises: (g) when a reflection coefficient of the load is within a chosen region of phase: (i) setting a capacitance value of the fourth variable capacitor to be a minimum capacitance of the fourth variable capacitor; (ii) determining capacitance values of the first, second, and third variable capacitors according to steps (a) through (e); and (iii) setting the capacitances of the first variable capacitor, the second variable capacitor, the third variable capacitor, and the fourth variable capacitor to be equal to respective capacitance values; and (h) when a reflection coefficient of the load is outside the chose region of phase: (i) setting a capacitance value of the fourth variable capacitor to be a maximum capacitance of the fourth variable capacitor, determining capacitance values of the first, second, and third variable capacitors according to steps (a) through (e), and determining a first maximum relative transducer gain value based on the capacitance values; (ii) setting a capacitance value of the fourth variable capacitor to be a predetermined capacitance between a maximum capacitance and a minimum capacitance of the fourth variable capacitor, determining capacitance values of the first, second, and third variable capacitors according to steps (a) through (e), and determining a second maximum relative transducer gain value based on the capacitance values; (iii) setting a capacitance value of the fourth variable capacitor to be a minimum capacitance of the fourth variable capacitor, determining capacitance values of the first, second, and third variable capacitors according to steps (a) through (e), and determining a third maximum relative transducer gain value based on the capacitance values; and (iv) setting the capacitances of the first variable capacitor, the second variable capacitor, the third variable capacitor, and the fourth variable capacitor to be equal to respective capacitance values corresponding to a highest of the first, second, or third maximum relative transducer gain values. 